For undergraduate or postgraduate measurement labs, and for classes in advanced measurements or instrumentation, this highly acclaimed text provides an unusually in-depth, analytical treatment of measurement methods and systems. Special features include: comprehensive coverage of measurement systems; flexible organization; greater emphasis on coordinate measuring machines; clean-room technology; surface roughness; machine vision and particle measurements.
Part One: General Concepts. Part Two: Measuring Devices. Part Three: Manipulation, Transmission, and Recording of Data.